Showing results: 211 - 225 of 473 items found.
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3954 -
Technobox, Inc.
The extender/analysis probe permits extension of a PMC card beyong the edge of a host processor front panel, providing access to both Side 1 and Side 2 of a PMC under test.
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IIB-3910-PC/AT -
Western Avionics Ltd.
The IIB-3910-PC/AT is a single slot intelligent interface card providing complete STANAG 3838 and STANAG 3910 test, simulation and bus analysis capability for PC compatible host systems
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P5563B -
Keysight Technologies
The Keysight P5563B PCIe 6.0 Protocol Test Backplane provides a convenient means for testing PCIe 6.0 add-in cards with a self-contained portable and powered passive backplane. The P5563B provides power required for all combination of exerciser and analyzer with device under test.
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8464 -
Technobox, Inc.
The Technobox, Inc P/N 8464 is a 3U VPX-to-PCI Express (PCIe) adapter that provides a convenient and cost-effective means for developing 3U VPX boards in a personal computer environment. It can also be used for production testing of 3U VPX boards. The adapter is a half-length PCIe card with the VPX card under test mounted close to the PCIe edge fingers to minimize signal lengths.
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Medalist i1000 Systems -
Keysight Technologies
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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CF test 222 -
Sycard Technology
The CF test 222 socket tester provides a quick and easy way of verifying the operation of a CompactFlash™ host socket. Housed in a standard 3.3mm CompactFlash™ card, the CF test is fully self-contained. The CF test socket tester verifies all signals on the CompactFlash™ interface including accurate Vcc measurements.
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CF test 220 -
Sycard Technology
The CF test 220 socket tester provides a quick and easy way of verifying the operation of a CompactFlash™ host socket. Housed in a standard 3.3mm CompactFlash™ card, the CF test is fully self-contained. The CF test socket tester verifies all signals on the CompactFlash™ interface including accurate Vcc measurements.
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STAr Technologies, Inc.
STAr's strong R&D with its high-quality manufacturing line enables the development of advanced parametric and reliability probe cards for low-leakage current tests, high temperature probing, and small pad contacts.
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STAr Technologies, Inc.
STAr's strong R&D with its high-quality manufacturing line enables the development of advanced parametric and reliability probe cards for low-leakage current tests, high temperature probing, and small pad contacts.
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STAr Technologies, Inc.
STAr has designed and developed MEMS (Micro-Electro-Mechanical Systems) type probe card suitable for testing of highly parallel large-array multi-DUT devices to increase productivity with greatly reduce cost-of-test.
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LSR-3230 -
W.M. Hague Company
* no fixture or probe cards on top side * 2, 4, and 6 wire test capability * touch screen operation * high performance DC electrical tester * high throughput - low running cost
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KEOLABS sas
The ContactLAB test platform provides fully configurable reader signal emulation for validation of ISO 7816 contact smart cards and Single Wire Protocol (SWP) USIM for NFC enabled mobile handsets.
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Samtec Inc.
Samtec's VITA 57.4 FMC+ HSPC Loopback Card provides FPGA designers an easy to use loopback option for testing low-speed and high-speed multi-gigabit transceivers on any FPGA development board or FPGA carrier card. It can run system data or BER testing on all channels in parallel. This makes evaluation and development with an FPGA much easier and is an ideal substitute for 28 Gbps test equipment.
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postrd -
PC Engines Gmbh
remote display kit for post4d, not RoHS compliant (can be considered test equipment, not subject to RoHS). Connects to PC Engines post4d PCI POST card (will not work with post2b or post5a). 20 inch cable, place display in a more accessible location. Ideal for software development or test fixtures.
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MS-100D -
CST Inc.
MS-100D has a very good architecture, with different probe card the same tester is able to test almost all DRAM DIE on the market, specially Mobile Low Power DRAM: LPDDR2, LPDDR3 & LPDDR4.